Abstract
Abstract The ‘Epistemic Uncertainty Workshop’ sponsored by Sandia National Laboratories was held in Albuquerque, New Mexico, on 6–7 August 2002. The workshop was organized around a set of Challenge Problems involving both epistemic and aleatory uncertainty that the workshop participants were invited to solve and discuss. This concluding article in a special issue of Reliability Engineering and System Safety based on the workshop discusses the intent of the Challenge Problems, summarizes some discussions from the workshop, and provides a technical comparison among the papers in this special issue. The Challenge Problems were computationally simple models that were intended as vehicles for the illustration and comparison of conceptual and numerical techniques for use in analyses that involve: (i) epistemic uncertainty, (ii) aggregation of multiple characterizations of epistemic uncertainty, (iii) combination of epistemic and aleatory uncertainty, and (iv) models with repeated parameters. There was considerable diversity of opinion at the workshop about both methods and fundamental issues, and yet substantial consensus about what the answers to the problems were, and even about how each of the four issues should be addressed. Among the technical approaches advanced were probability theory, Dempster–Shafer evidence theory, random sets, sets of probability measures, imprecise coherent probabilities, coherent lower previsions, probability boxes, possibility theory, fuzzy sets, joint distribution tableaux, polynomial chaos expansions, and info-gap models. Although some participants maintained that a purely probabilistic approach is fully capable of accounting for all forms of uncertainty, most agreed that the treatment of epistemic uncertainty introduces important considerations and that the issues underlying the Challenge Problems are legitimate and significant. Topics identified as meriting additional research include elicitation of uncertainty representations, aggregation of multiple uncertainty representations, dependence and independence, model uncertainty, solution of black-box problems, efficient sampling strategies for computation, and communication of analysis results.
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