Abstract

We show that a thermal light source which is random in the transverse direction can produce a sub-wavelength double slit interference in a joint intensity measurement. This is the classical version of quantum lithography, and it can be explained with the correlation of rays instead of the entanglement of photons.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call