Sub‐THz characterisation of multi‐walled carbon nanotube thin films using vector network analyser

S Puthukodan,D.‐M Lee,V.K.T Vinod,J.‐L Coutaz,H.K Nguendon,J.‐F Lampin,E Dadrasnia,G Ducournau,F Garet,H Lamela,S Baik

doi:10.1049/el.2013.4136

Sub‐THz characterisation of multi‐walled carbon nanotube thin films using vector network analyser

S Puthukodan, D.‐M Lee + Show 9 more

https://doi.org/10.1049/el.2013.4136

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Journal: Electronics Letters	Publication Date: Feb 1, 2014
Citations: 7

Affiliation: Carlos III University of Madrid, University of Lille, Los Angeles Harbor College, Institut de Microélectronique, Electromagnétisme et Photonique, Wonkwang University, Sungkyunkwan University

#Multi-walled Carbon Nanotube Thin Films #Properties Of Multi-walled Carbon Nanotube + Show 8 more

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Abstract

A vector network analyser is used to study the electrical properties of multi-walled carbon nanotube (MWCNT) thin films deposited on a fused quartz substrate in the sub-terahertz (THz) frequency ranges of 220-325 GHz (WR3.4) and 325-500 GHz (WR2.2). The experiment is performed in free space. The complex permittivity of the MWCNT thin films is extracted using the Nicholson-Ross-Weir method. The refractive index and conductivity are then determined from the extracted permittivity. The method is validated by comparison with values obtained using THz time-domain spectroscopy.

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