Abstract
A system for measuring the subthyristor parameters of GTO (gate-turn-off) thyristors is presented. With the aid of a personal computer the gate breakdown voltage and leakage current, the turn-on and turn-off times, and the forward voltage drop of each subthyristor can be automatically measured, stored, and statistically evaluated. The cumulative frequency and distribution of the gate breakdown voltages on an ordinary pellet are discussed. A further example shows the distributions of gate breakdown voltage and turn-off times on a pellet with a doping inhomogeneity. >
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
