Abstract
AbstractTransmission electron microscopy and X-ray .line profile analysis have been used to study the dislocation substr~cture of an SAP (Sintered Aluminum Powder) alloy containing 10.3 wt pct Al2O3, as-extruded and after different thermomechani cal treatments. Analysis of X-ray data indicated an essentially random dislocation configuration, even though cells or subgrains were clearly seen in the microscope. The average size of coherently diffracting domains was 800 to 1000 A°, much smaller than the cells seen by TEM. The substructure is thus visualized to consist of cells within the walls of which are very small units (domains) bounded by single dislocations. The 0.2 pct offset flow stress at 20C of the SAP in different conditions can be fully accounted for by approximately equal contributions from (a) substructure hardening, and (b) dispersion strengthening due to the oxide particles. Resume La microscopie electronique par transmission et l'analyse des lignes de profil de rayons-X ont ete employees pour...
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