Abstract
The structure characteristic of substrate is a key parameter to modify the structure of as-grown thin film and tune physical properties for oxide thin film materials. Three various substrates are selected to identify the change of structure as well as ferroelectric and magnetic properties of the fabricated Bi0.9Ba0.1FeO3 thin film. XRD and TEM combined with AFM were used to confirm the detailed structure and epitaxial growth of Bi0.9Ba0.1FeO3 thin film on different substrates. Correspondingly, the changes of the ferroelectric and magnetic properties were investigated. It is found that the lattice mismatch between substrate and thin film significantly promotes the structure distortion of Bi0.9Ba0.1FeO3 thin film inducing the change of ferroelectric and magnetic properties. Our results further reveal that the structure characteristic of substrate plays a major role in determining the structure of epitaxial thin film and the enhancement of physical properties, which sheds light to understanding the effect of lattice mismatch in many other functional oxide thin films as well.
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