Abstract
In this chapter an analysis of different alternatives for substrate biasing is presented. In previous chapters we analyzed the characteristics of noise propagation and coupling to and from devices were analyzed. Now we will focus on the noise propagated through power-supply lines. Noisy supply lines may couple disturbances through the substrate contacts, and noise at the substrate may be coupled to analog supply lines, too. A simulation analysis is here presented, from which the advantages and drawbacks of bias approaches, number of substrate contacts, or the effect of pads, are discussed. The chapter also contains an evaluation of the probability of latch-up in some of the biasing situations proposed, triggered either by noise at supply lines or by substrate noise.
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