Abstract
A new dynamic method is proposed for measuring the spectral hemispherical-directional reflection coefficients within the spectral range 0.4–1.1μm in vicinity of high-temperature phase transformations of refractory oxides. Diffuse polychromatic irradiation of the tested sample makes it possible to exclude the effect of a sharp change of the indicatrix of reflection in the case of phase transformations and to obtain a large bulk of data for exact determination of the temperatures of phase transitions. The methodical error in determination of the spectral hemispherical-directional reflection coefficients does not exceed 2% within the investigated temperature range.
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