Abstract

When an X-ray photon lands into a pixel (event pixel), the primary charge is mainly collected into the event pixel. If the X-ray landing position is sufficiently close to the pixel boundary, the primary charge spills over to the adjacent pixel forming split events. We can easily understand that there are three parameters coupled together; the X-ray landing position inside the pixel, the X-ray event pattern and the primary charge cloud shape. We can determine any one of them from the other two parameters. Since we know the charge cloud shape using the multi-pitch mesh experiment, we can calculate the X-ray landing position with subpixel resolution using the event pattern. We applied our method to Ti–K X-rays for the charge-coupled device with 12 µm square pixel. Once the primary charge splits into the adjacent pixel, we can determine the X-ray landing position with subpixel resolution. Using three- or four-pixel split events, we can determine the X-ray landing position with an accuracy of less than 1 µm. For a two-pixel split event, we obtained a similar position accuracy in the split direction with no improvement in the direction perpendicular to it. We will discuss the type of charge-coupled device (CCD) which can achieve the subpixel resolution for the entire area of the CCD.

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