Abstract
Subpixel Edge Localization (EL) techniques are often affected by an error that exhibits a systematic character. When this happens, their performance can be improved through compensation of the systematic portion of the localization error. In this paper we propose and analyze a method for estimating the EL characteristic of sub-pixel EL techniques through statistical analysis of appropriate test images. The impact of the compensation method on the accuracy of a camera calibration procedure has been proven to be quite significant (44%), which can be crucial especially in applications of low-cost photogrammetry and 3D reconstruction from multiple views.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
