Abstract

This paper covers improvements to a photoinjector that lead to the realization and measurement of submicron normalized emittance for a 0.5 nC electron beam at the Brookhaven Accelerator Test Facility. A fitting procedure utilizing beam size measurements from multiple beam profile monitors along the transport line was used instead of more traditional techniques. Such a small emittance beam in combination with a tight focusing scheme allowed us to achieve 10 μm RMS beam sizes at 60 MeV. The behavior and limitations of different BPM screens is compared for such beams.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.