Abstract
In the last two decades, nano manipulation has been recognized as a potential tool of scientific interest especially in nanotechnology and nano-robotics. Contemporary optical microscopy (super resolution) techniques have also reached the nanometer scale resolution to visualize this and hence a combination of super resolution aided nano manipulation ineluctably gives a new perspective to the scenario. Here we demonstrate how specificity and rapid determination of structures provided by stimulated emission depletion (STED) microscope can aid another microscopic tool with capability of mechanical manoeuvring, like an atomic force microscope (AFM) to get topological information or to target nano scaled materials. We also give proof of principle on how high-resolution real time visualization can improve nano manipulation capability within a dense sample, and how STED-AFM is an optimal combination for this job. With these evidences, this article points to future precise nano dissections and maybe even to a nano-snooker game with an AFM tip and fluorospheres.
Highlights
Integrated microscopic tools have played an important role in deriving multi dimensional know-how of a scientific scenario [1]
For atomic force microscope (AFM) imaging in the intermittent contact (IC) mode, the information extracted is the relative height from substrate and in the case of spheres; it is same as the diameter of the object
In order to test how the information gained by these imaging modes match, a confocal image, a stimulated emission depletion (STED) image (2B) and an AFM image (2C) of the same region of interest in a sample made from a mixture of 20 nm and 40 nm crimson fluorescent beads are cross-matched and verified in a quantifiable manner
Summary
Integrated microscopic tools have played an important role in deriving multi dimensional know-how of a scientific scenario [1]. Combining an atomic force microscope (AFM) with light microscopy techniques like confocal microscopy has become a standard tool for various studies carried out using AFM [3][4] and a step ahead to use a super resolution technique like STED with AFM is just in the path of evolution of nano scale techniques. STED (Stimulated emission depletion) microscopy [5][6] is a top contender in fluorescence based super resolution microscopy techniques. AFM (Atomic force microscopy) surpasses other microscopy techniques due to its simplicity in probing the sample. The method fluorescent tagging, super resolution imaging of the resultant structures and measurement of the force maps of an area of interest inside a eukaryotic cell was reported from our group [2]
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