Abstract
Surface Enhanced Raman Spectroscopy (SERS) is a valuable analytical tool for the investigation of molecules adsorbed on roughened noble metal surfaces. The shape, size, and surrounding of the metal protrusions play an important role in the Raman scattering enhancement. By combining scanning near-field optical microscopy (SNOM) with Raman spectroscopy the spatial resolution suffices for investigating isolated silver islands on SERS active substrates. We demonstrate an optical resolution below 70 nm for recording spectra on specifically prepared and fully characterized SERS substrates. For a quantitative evaluation of the SERS signal the spatial distribution of Rhodamine 6G (R6G) deposited on the SERS substrate was determined by friction force measurements. By comparing the Raman intensities of the SERS substrates with those of unmetallized support plates absolute SERS enhancement factors at specific locations on top and in the vicinity of the silver islands were determined directly.
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