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Abstract
X‐ray diffraction studies are carried out in order to probe the smectic layer structure in liquid crystal devices filled with FLC mixture SCE8 and AFLC mixture CS4001, at a temperature just above the SmA*–SmC* phase transtion. The data gathered are time‐resolved in synchronization with a bipolar voltage pulse applied across the device. The layers are observed to move dynamically and reversibly with voltage application and removal, giving evidence for temporary vertical chevron formation due to the electroclinic effect on a timescale consistent with this phenomenon.
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