Abstract
A technique is presented on tracing the sub-micron pinholes that result in black spots in organic light-emitting diodes (OLED) when exposed to ambient atmosphere. The mystery about the type and nature of tiny pinholes present in the OLED cathode that allow oxygen and/or moisture ingress in minute quantities causing black spot formation, is clarified. The technique can accurately locate nanodefects or pinholes in the center of black spots of various sizes, even on a centimeter scale. Pinholes in the investigated OLEDs were shown to be caused by different particles originating from various locations in the device stack. Defects in the Ba-Al cathode of a solution processed polymer LED (PLED) and pinholes in the LiF-Al cathode of a thermally evaporated small molecule organic LED (smOLED) were investigated and compared. The technique is a powerful tool for inspection and can, thereby, accelerate the process optimization for OLED fabrication.
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