Abstract
We report on the characterization of sub-Doppler resonances detected by probing the 6S1/2 - 7P1/2 transition of the Cs atom at 459 nm in a microfabricated vapor cell. The dependence of the sub-Doppler resonance (linewidth, amplitude) on some key experimental parameters, including the laser intensity and the cell temperature, is investigated. These narrow atomic resonances are of interest for high-resolution spectroscopy and instrumentation and may constitute the basis of a high-stability microcell optical standard.
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