Abstract
Although significant improvements in performance have been reported for monolithic perovskite/silicon tandem solar cells (PVSK/Si TSCs), the lack of simple electrical characterization methods impedes further development of monolithic TSCs. In this article, we report comprehensive electrical characterization methods that can accurately and easily analyze the sub-cells of two-terminal PVSK/Si TSCs. Using a highly efficient three-terminal PVSK/Si TSC conceived for the sub-cell analysis, fundamental electrical characterization methods, such as J - V characteristics, external quantum efficiency, impedance spectroscopy, and thermal admittance spectroscopy, are investigated to suggest a characterization platform for the sub-cell analysis of monolithic two-terminal PVSK/Si TSCs. • Sub-cells of monolithic perovskite/silicon tandem solar cells are characterized • Sub-cell-selective light bias enables simple nondestructive analysis • 3-T device is used to validate the suggested methods • J-V , EQE, EIS, and TAS of the sub-cells are investigated Park et al. report sub-cell characterization methods for monolithic perovskite/silicon tandem solar cells. By using sub-cell-selective light biases and highly efficient monolithic three-terminal perovskite/silicon tandem solar cells, the J-V characteristics, external quantum efficiency, impedance analysis, and thermal admittance spectroscopy of the sub-cells are analyzed.
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