Abstract

Purpose:To establish a simple relation of backscatter dose enhancement around a high‐Z dental alloy in head and neck radiation therapy to its average atomic number based on Monte Carlo calculations.Methods:The PHITS Monte Carlo code was used to calculate dose enhancement, which is quantified by the backscatter dose factor (BSDF). The accuracy of the beam modeling with PHITS was verified by comparing with basic measured data namely PDDs and dose profiles. In the simulation, a high‐Z alloy of 1 cm cube was embedded into a tough water phantom irradiated by a 6‐MV (nominal) X‐ray beam of 10 cm × 10 cm field size of Novalis TX (Brainlab). The ten different materials of high‐Z alloys (Al, Ti, Cu, Ag, Au‐Pd‐Ag, I, Ba, W, Au, Pb) were considered. The accuracy of calculated BSDF was verified by comparing with measured data by Gafchromic EBT3 films placed at from 0 to 10 mm away from a high‐Z alloy (Au‐Pd‐Ag). We derived an approximate equation to determine the relation of BSDF and range of backscatter to average atomic number of high‐Z alloy.Results:The calculated BSDF showed excellent agreement with measured one by Gafchromic EBT3 films at from 0 to 10 mm away from the high‐Z alloy. We found the simple linear relation of BSDF and range of backscatter to average atomic number of dental alloys. The latter relation was proven by the fact that energy spectrum of backscatter electrons strongly depend on average atomic number.Conclusion:We found a simple relation of backscatter dose enhancement around high‐Z alloys to its average atomic number based on Monte Carlo calculations. This work provides a simple and useful method to estimate backscatter dose enhancement from dental alloys and corresponding optimal thickness of dental spacer to prevent mucositis effectively.

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