Abstract
High-precision measurements of the relative intensities of KX- and γ-rays associated with the decay of the isomer state in 177Lu (T 1/2 = 160.44 days) are performed using a γ spectrometer that incorporates four different types of semiconductor detectors. Detailed analysis of the balance of intensities of the excited levels in 177Lu and 177Hf confirms the consistency of the obtained data. The intensities of the γ- and β—decay branches of the isomer and the internal conversion coefficients of the K-forbidden transitions are determined.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Bulletin of the Russian Academy of Sciences: Physics
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
