Abstract
Soft x-ray emission spectroscopy has been employed to study the local chemical environment of sulfur atoms in sulfide II–VI semiconductors (ZnS, CdS, HgS) and CdS/ZnSe superlattices. By using fluorescence transitions involving metal d-state-derived valence bands and S 2p core holes, a distinction between S–Zn and S–Cd bonds in the superlattices can be made. We find that, in addition to the expected S–Cd bonds, interfacial S–Zn bonds are present in superlattices grown at 170 °C, and that the amount of S–Zn bonds significantly increases for growth at 300 °C due to interface intermixing.
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