Abstract

This study investigates the impact of the interface roughness on a layered photonic crystal as a gas sensor based on Tamm resonance in the terahertz range. The well-known transfer matrix method is used for simulation. The sensor's performance is observed for various thicknesses of the rough layer (exponential-graded refractive index layer) between the adjacent layers. The rise in the rough layer between adjacent porous and cavity layers causes a decrease in sensitivity but enhances the quality factor and figure of merit of the proposed structure. However, the change in the thickness of the rough layer between the metallic and the last cavity layer does not affect the performance.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.