Abstract
Electric field distribution and field emission current over the surface of point (sphere-on-cone) and wedge-shaped defects on a plane substrate are studied. It is found emission current due to wedge-shaped defects is more sensitive to emitter-anode distance than in case of point conical defects. This property is consequence of greater emission area of wedge-shaped defects and has important practical applications. The computer model in Matlab of field electron emission from emitter-defects arrays is used. Electrostatic simulation of electron transport processes with PDE Toolbox finite element solutions is implemented. The effects of the variations in defects geometrical structure and parameters on its potential distribution, electric field, and emission current are discussed. It is found that with increase of distance from the tip or the edge of defect the current density falls very fast and greater part of emission current is in fact produced by a very small area near the emitter tip. The closer the emitter and collector are to each other, the less significant the inter-defect distance becomes.
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