Abstract
In this research, ZnO nanostructure films were prepared using pulsed laser deposition method on glass substrates ina room temperature. The ZnO nanostructures were characterized by X-ray diffraction and atomic force microscopy (XRD, AFM). Thegrownthin films have a polycrystalline wurtzite structure, it can be seen that the highest texture coefficient was inplane (101), with grain sizes between (41nm-65nm), morphology of the film wasstudied and showed that the average root mean squareincreases with the thickness of the films, with RMS between (197nm-206nm).
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