Abstract
As an accurate technique, spectroscopic ellipsometry (SE) is utilized to study the dielectric function (ε = εr + iεi) of spinel oxide MgTi2O4 (MTO) thin films with good orientation. C-axis lattice length and Ti ions valence state are characterized by X-ray diffraction and X-ray photoelectron spectroscopy, respectively. Here, we find that c-axis lattice constants have the positive correlation with band gaps which are obtained by fitting the spectra of d2(E2εi)/dE2 via standard critical points model in MTO, and this phenomenon can be revealed by the Ti ions valence state. Moreover, the band gap value of MTO measured by experiment is consistent with the result of first-principles calculations.
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