Abstract

The L X-ray intensity ratios (ILα/ILl, ILα/ILβ, ILα/ILγ) and radiative vacancy transfer probabilities ηL3-Xi (X = M, N, O i = 1, 4, 5) have been measured for Hg compounds, Pb and its compounds, Bi and its compounds using synchrotron radiation. The L X-ray photons emitted from the elements and compounds are detected with silicon drift detector. The measured intensity ratios and ηL3-Xi (X = M, N, O i = 1, 4, 5) have been compared with theoretical and other experimental values. Experimentally, it is observed that intensity ratios are independent of crystal structure but ηL3-Xi (X = M, N, O i = 1, 4, 5) are strongly depends on crystal structure.

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