Abstract
Four experiments were conducted to provide further support for a dual-process approach to conjunction errors in recognition memory over a single-process approach. In Experiments 1, 2a, and 2b study words were repeated once (2 presentations) or several times (8 or 16 presentations), and a response signal delay (RSD) was manipulated (short vs long). Short RSD groups produced lower hit rates but higher conjunction error rates compared to long RSD groups. Repetition effects on conjunction errors occurred for short RSD but not long RSD groups. In Experiment 3, additional judgements on new items were solicited to show that the “null” effects for long RSD groups in the earlier experiments were, in fact, illusory. Together, the experiments provide evidence for recollection-based rejections of conjunction lures and support a dual-process theory of recognition memory over a single-process model.
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