Abstract
The Ceylon Journal of Science is a peer-reviewed journal published quarterly by the University of Peradeniya, Sri Lanka in March, June, September and December. It is aimed at publishing high quality research articles on topics related to different disciplines in Science. The journal accepts original research articles, book reviews, reviews and mini-reviews, short communications, opinions, research notes, and commentaries and notes. The journal strictly adheres to publication ethics as emphasized by the Committee on Publication Ethics (COPE). The Journal has its own website.The Ceylon Journal of Science is indexed in Sri Lanka Journals Online (SLJOL), Directory of Open Access Journals (DOAJ), Google Scholar and Zoological Records. According to the Google Scholar; H5-Index: 12H5-Median: 15According to the Exaly (1970 – 2021); Impact Factor: 0.6 (top 19%)Extended IF: 0.6 (top 19%) H-Index: 8 (top 28%)Citations/paper: 1.42
Highlights
A non-destructive angle-resolved X-ray photoelectron spectroscopy (AR-XPS) has been extensively used by several scientists for characterizing the in-depth concentration profiles of a thin film (Bare et al, 2016) because it has various advantages over several destructive surface analysis techniques (Demchenko et al, 2018)
Results of the depth profiling analyses of these corrosionresistant W-xNb alloys by AR-XPS technique revealed that such corrosion action of the alloys is largely owing to the occurrence of homogeneous passive layers with Wox and Nb5+ ions without in-depth concentration variations after immersion in 12 M hydrochloric acid, open to air, at 30 °C
The AR-XPS demonstrates a promising depth profiling examination of the distribution of the elements in different depth layers of a thin film to look into constituent elements, chemical, electronic (Alba et al, 2020), magnetic (Ciocarlan et al, 2020), and surface-sensitive (Hernandez et al, 2017) properties of the films formed on any solid substrates
Summary
A non-destructive AR-XPS has been extensively used by several scientists for characterizing the in-depth concentration profiles of a thin film (Bare et al, 2016) because it has various advantages over several destructive surface analysis techniques (Demchenko et al, 2018). The results of recent AR-XPS studies of the native oxide films formed on titanium-based binary alloys containing more than 40 wt.% showed excellent corrosion performance in an aerated Hank’s solution, mostly due to the homogeneous distribution of Ta2O5 in the top-most layer of the alloy surface (Mendis et al, 2020). It was investigated an air exposure effect on the passivity of a steel electrode in glutarate solution, and the results gave evidence that passivity was favored by progressively hydroxylated native oxide films from the AR-XPS analysis though the film disclosed the bilayer structures (ChanRosado and Pech-Canul, 2019)
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
