Abstract
A Tungsten–Titanium (W–Ti) diffusion barrier was prepared on an iron (Fe) substrate by means of magnetron sputtering with subsequent annealing at different temperatures. Rutherford Backscattering Spectrometry (RBS) was used to analyze the Fe distribution in the W–Ti layer. The diffusion constant D0=3.4×10−16m2/s and the activation energy Q=43kJ/mol of the Fe diffusing in the W–Ti layer were subsequently calculated based on Fick’s Second Law. The results demonstrated that a 291nm-thick W–Ti barrier layer can be used to block Fe from diffusing into a CIGS solar cell for 20years at a work temperature of 308K (35°C).
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
