Study on the optimal algorithm prediction of corn leaf component information based on hyperspectral imaging

Abstract

Genetic algorithm (GA) has a significant effect in the band optimization selection of Partial Least Squares (PLS) correction model. Application of genetic algorithm in selection of characteristic bands can achieve the optimal solution more rapidly, effectively improve measurement accuracy and reduce variables used for modeling. In this study, genetic algorithm as a module conducted band selection for the application of hyperspectral imaging in nondestructive testing of corn seedling leaves, and GA-PLS model was established. In addition, PLS quantitative model of full spectrum and experienced-spectrum region were established in order to suggest the feasibility of genetic algorithm optimizing wave bands, and model robustness was evaluated. There were 12 characteristic bands selected by genetic algorithm. With reflectance values of corn seedling component information at spectral characteristic wavelengths corresponding to 12 characteristic bands as variables, a model about SPAD values of corn leaves acquired was established by PLS, and modeling results showed r=0.7825. The model results were better than those of PLS model established in full spectrum and experience-based selected bands. The results suggested that genetic algorithm can be used for data optimization and screening before establishing the corn seedling component information model by PLS method and effectively increase measurement accuracy and greatly reduce variables used for modeling.