Abstract
In the semiconductor industry, during the component level reliability evaluation, the non-accelerated soakage testing in the precondition is normally proceeded, which takes much time. In order to reduce the soaking time, three accelerated soaking conditions are studied with reference to non-accelerated soaking condition (JEDEC Level 3 and JEITA Rank E). Under the three accelerated soaking conditions, the moisture gain and moisture distribution are studied and confirmed by FEA (Finite Element Analysis). Also, the failure is studied under the three accelerated conditions compared with those of non-accelerated soaking conditions. Thereby, the time to fail of the component is determined.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
