Study on Surface Magnetic Domain Structure of Thin-Gauged 3%Si-Fe Strips Using Scanning Electron Microscope with Polarization Analyzer

Abstract

Due to the important soft magnetic characteristics, 3%Si-Fe strips have been extensively studied and is currently used as core material of distribution and power transformers where energy losses during magnetization are of critical concern. It is well known that the energy loss decreases significantly with decreasing thickness of 3%Si-Fe strips. (110)[001] Goss texture in thin-gauged 3%Si-Fe strips is developed through a tertiary recrystallization process which is induced by the difference in surface energy of (110) and other grains. To reduce the energy losses of 3%Si-Fe strips, the domain modification by the application of uniaxial tensile stress, mechanical scribing and laser scribing has been developed, but there are few studies on the domain structure of the thin-gauged Si-Fe strips. In this study, the magnetic property, B{sub 10}(T), is controlled by changing the reduction ratio per pass are (hereafter, reduction rate) in cold rolling 3%Si-Fe plates, and surface magnetic domain structures each are imaged using scanning electron microscope with polarization analyzer (SEMPA).