Abstract
White light interference technique for topography measurement effectively avoids phase ambiguity in phase-shifting interferometry. The spatial frequency domain algorithm based on scanning white light interference technique has the advantage of insensitivity to noise and higher calculation accuracy compared with other methods. The white light interference sensor is constructed based on nano positioning and nano measuring machine (NMM), the calibrated step height standard of 100±3nm is measured. The spatial frequency domain algorithm is adopted for data processing, the repetitive test result of 97.9nm and standard deviation of 0.48nm are achieved. To verify the measuring ability of complex device, the number ‘242’ on ink box is measured and three-dimensional reconstruction is conducted. The high precision and traceable measurements of micro/nano scale step height standard and complex devices are realized by the white light interference system based on NMM with steady frequency laser interferometer built-in.
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