Abstract
Amorphous samples of V 2O 5 films have been thermally evaporated on unheated glass substrate with different film thicknesses using high-purity V 2O 5 powder. The structural characteristics of the V 2O 5 powder as well as a sample of 181 nm thickness were investigated using X-ray diffraction. The optical properties of the prepared films were studied by transmittance and reflectance measurements, and the integrated transmittance ( T UV, T V, T NIR) and absorptance (A UV , A V , A NIR ) in the UV, VIS and NIR regions were calculated. They were found to be strongly affected by the film thickness. The dependence of absorption coefficient and the refractive index on wavelength for the prepared sample was also reported.
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