Abstract
Silicon nitride film containing hydrogen is widely used as antireflection layer and passivation layer in the field of solar cell industrial production. Silicon nitride films containing hydrogen were prepared by industrial plasma enhanced chemical vapor deposition (PECVD) equipment. Fourier Transform Infrared Spectroscopy (FTIR) was used to analyze the composition of the film, to study the influence of reaction gas flow rate and high-frequency power on the composition and properties of the film, and to study the influence of silicon nitride film composition on the passivation effect of the silicon wafer through the minority carrier life of the silicon wafer, so as to clarify the direction of process adjustment in actual industrial production.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
