Abstract
Aiming at the thermomigration problem caused by the large temperature gradient (TG) of micro-soldering joints, a constant temperature thermomigration device with temperature control function was designed and manufactured. This paper studied the polarity phenomenon, crystallographic characteristics, and interfacial intermetallic compound (IMC) growth kinetics of Ni-GNSs reinforced Sn2.5Ag0.7Cu0.1RE/Cu solder joints under thermomigration. The results indicate that Ni-GNSs reinforced Sn2.5Ag0.7Cu0.1RE/Cu solder joints exhibited a significant thermomigration polarity phenomenon under the conditions of TG ≥ 1000 °C/cm and θ ≤ 43.5° between the c-axis and TG of β-Sn grains. At the cold end of the solder joint, the Cu6Sn5 phase at the interface gradually thickens and forms Cu3Sn phase on the substrate side, while microcracks expanded and gradually developed into macrocracks. At the hot end of the interface, the Cu6Sn5 phase gradually dissolved. The growth of the Cu3Sn phase was accompanied by “Kirkendall voids” that formed cracks at the interface between the joint and the solder until a “fully IMC solder joint” was formed. The growth of Cu6Sn5 IMC at the solder joint interface came before that of Cu3Sn IMC. The average temperature and temperature gradient of the solder joint were correlated with the growth of Cu3Sn IMC, leading to the formation of interface Cu3Sn IMC due to the oversaturation of Cu atoms. The addition of 0.05 wt% Ni-GNSs refines the grain structure and increases the activation energy for the growth of Cu6Sn5 and Cu3Sn IMC at the cold end of the solder joint, suppressing the thermomigration polarity phenomenon.
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