Study on IGBT Module Aging and Automatic Test Systems

Abstract

A set of accelerated aging and automatic test system for IGBT modules is designed in this paper, including platforms of accelerated aging and parameter automatic test. Aging test platform is controlled by IPC, using DC power cycling methods and water cooling to heat dissipation. Combined with LabVIEW and high-speed digitizers, single pulse switch testing is achieved in automatic test platform through hardware circuit. In different stages of the IGBT module aging tests, change trend of each electrical parameters were measured under different working point. Collector-emitter conduction voltage drop VCE(sat), gate-emitter threshold voltage VGE(th), turn-off time toff, the current and voltage waveform during turn-on and turn-off are measured. The relationship between these electrical parameters and aging degree of the IGBT module is researched. It would be able to characterize the device and seek out external indicators of fatigue aging, reliable evidences for state assessment. Compared with the traditional manual testing methods, the automatic test system has characters: high accuracy, test speed, short development cycle and so on.