Abstract
In this paper, we propose and analyze a Gain Transient Perturbation (GTP) model to study the transient stability of THick Gas Electron Multiplier (THGEM). This model can be used to explain the instability of Micro Pattern Gaseous Detectors (MPGDs). Furthermore, the transient gain stability of THGEM was analyzed using the method of multi-physical field coupling. Simulations were carried out to study the influence of internal factors, namely, the size of the insulation rim, the conductivity of substrate materials and the relative dielectric constant of filling gas on the transient gain stability of THGEM. Using an experimental setup the counting rate of the THGEM was measured and the results were found to be in good agreement with the simulation results.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
