Abstract
This paper provides proof of concept for a technique that uses high resolution thermal infrared imager to detect faults for outdoor operation photovoltaic array. An experimental study focused on two situations was tested: abnormal emitting heat of monocrystalline silicon solar cells (hot spot); open circuit fault of photovoltaic array. Experimental results show that the infrared image could clearly give prominence to the faulty solar cell or PV array. The back surface temperature of solar cell with hot spot is higher than normal ones with 13.2°C in mean value，and the back surface temperature of open circuit PV array is higher than normal ones with 2.8°C in mean value.
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