Abstract

The equivalent single conductor (ESC) model provides an efficient way for transient simulation of complex multi-walled carbon nanotube (MWCNT) interconnects. In this paper, the validity and accuracy of the ESC model of MWCNT are investigated when the impacts of intershell tunneling conductance and imperfect contact resistance are considered. Both the voltage distribution and terminal response are compared with the multiconductor circuit (MCC) model. Some discussions based on the numerical results of single and coupled MWCNT interconnects are given.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.