Abstract
Positron-annihilation induced auger electron spectroscopy (PAES) and electron induced auger electron spectroscopy (EAES) have been used to study the elemental composition from the systems of Fe/Cu(1 0 0) and Au/Si(1 0 0). Attenuation of Auger electron intensities was estimated using model surface structures and compared with the measured PAES and EAES intensities. PAES gives the atomic concentration of the top-most atomic layer while EAES analyzed the 3–10 atomic layers with a characteristic intensity that decreases exponentially with depth from the surface. Measurements of PAES and EAES intensities as a function of the quantity of thin films from Fe/Cu(1 0 0) and Au/Si(1 0 0) indicated island formation of Fe on Cu(1 0 0) substrate and island formation of Au layers after making a couple of Au monolayers on Si(1 0 0) substrate.
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