Abstract

In ordinary electron micrographs of MoO 3 crystals and mica films, which were obtained by using our universal electron diffraction microscope as ordinary electron microscope unit, there observed the well-known patterns which may be called “a group of closed contours” “dark spots” and “feather-like patterns” and further some patterns were also observed which may be called “wave-like patterns”. These patterns could be analysed by using the universal electron diffraction microscope as shadow microscope unit and high resolution electron diffraction camera. In the high resolution electron diffraction patterns and in the diffracted parts of shadow micrographs of bent, films of the crystals obtained by the universal electron diffraction microscope, the subsidiary maxima were observed which correspond to the intensity region in the reciprocal lattice extended in the direction normal to the film surface, and from the angular distances of the subsidiary maxima, the thickness of the film, Fourier coefficient of peri...

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