Study of thickness dependent sputtering in gold thin films by swift heavy ion irradiation

Abstract

Gold thin films of varying thickness (10–100nm) grown on silica substrates by e-beam evaporation method were irradiated by 120MeV Au ions at 3×1012 and 1×1013ionscm−2 fluences. Irradiation induced modifications of these films were probed by glancing angle X-ray diffraction (GAXRD), atomic force microscopy (AFM), Rutherford backscattering spectrometry (RBS) and surface enhanced Raman scattering (SERS). Irradiation didn’t affect the structure, the lattice parameter or the crystallite size, but modified the texturing of grains from [111] to [220]. RBS indicated thickness dependent sputtering on irradiation. The sputtering yield was found to decrease with increasing thickness. AFM indicated increase of roughness with increasing irradiation fluence for films of all thickness. In agreement with the AFM observation, the gold nanostructures on the surface of 20nm thick film were found to increase the SERS signal of acridine orange dye attached to these structures. The SERS peaks were amplified by many fold with increasing ion fluence. The effect of 120MeV Au ion irradiation on the grain texture, surface morphology and SERS activity in addition to the thickness dependent sputtering in gold thin films are explained by the thermal spike model of ion-matter interaction.