Abstract
Abstract CN x amorphous films have been prepared by reactive magnetron sputtering in a pure N 2 discharge. The films grown on NaCl have been characterised by Fourier transform infrared spectroscopy (IR), transmission electron microscopy (TEM), and electron energy loss spectroscopy (EELS). C/N atomic ratios have been determined by EELS with values in the range 2.0–1.2 for samples grown under different conditions. The thermal stability of the films upon heating in vacuum was followed ‘in situ’ at the transmission electron microscope by EELS. This study has been completed by a thermogravimetric and mass spectrometer analysis of evolved gases upon heating in nitrogen flow and vacuum, respectively. Under these conditions the films are stable up to 1023 K. Above this temperature the films decompose by elimination of nitrogen remaining a carbonaceous residue. The thermal stability of the films upon annealing in air was studied by following the evolution of the X-ray photoelectron spectroscopy (XPS) peaks during heating in air of films grown on steel. Deconvolution analysis of the XPS spectra allows to determine the evolution of the different type of bonds. In particular pure carbon in the films appears more reactive to oxygen than CN and C–N bonds.
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