Abstract
B2-type CuZr phase is a ductile intermetallic phase which is beneficial to the excellent plasticity of CuZr-based bulk metallic glass (BMG) composites. Studying the crystallization process of CuZr-based BMGs will be helpful in understanding the forming mechanisms of CuZr phase. In the present paper, electrical resistivity measurement and X-ray diffraction were carried out to study the crystallization behaviour of Cu50Zr50 amorphous alloy. The B2 CuZr phase forms at 997 K, intriguingly, the inverse process shows a temperature hysteresis of 117 K. The hysteresis temperature during cooling process is believed to be beneficial in stabilizing B2 CuZr phase when fabricating B2 CuZr reinforced BMG composites. Knowing the characteristics of B2-type CuZr phase will be helpful in exploring CuZr-based BMG composites.
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