Abstract
At the RKFM stations in the NRC ‘Kurchatov institute’ the peculiarities of the effect of redistribution of the intensity of the diffracted synchrotron beam in the X-cut quartz crystals at the excitation of transverse resonant ultrasonic vibrations were studied. The dependences of the intensity of the diffracted X-ray beam on the resonant frequency voltage of the signal are obtained, and it is shown that the results are consistent with those previously received in laboratory conditions. Also, the temporal characteristics of the observed intensity redistribution effect were obtained and studied for the first time.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Contemporary Physics (Armenian Academy of Sciences)
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
