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Abstract
For the purpose of monitoring the level of plasma impurity (especially tungsten) and its distribution reconstruction at tokamaks (ITER in particular), a Soft X-Ray (SXR) tomographic diagnostics based on Gas Electron Multiplier (GEM) detectors with energy discrimination has been extensively considered for a while. Coupled with advanced electronics, GEM detectors offer excellent time and space resolution, as well as a charge spectrum from which the SXR photon spectrum can be deconvolved. In addition, they are less subjected to a neutron damage as compared to standard semiconductor diodes. This contribution highlights the latest studies supporting the development of such diagnostics focusing on laboratory tests to examine: (a) the impact of GEM holes geometry on the properties and distribution of the electron avalanche; (b) the effect of the high rate photon flux on GEM foil performance; and (c) the optimal electric field distribution.
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