Abstract
Lead zirconate–titanate films to be used as the active and adhesion layers in a ferroelectric structure have been studied. The layers are obtained by magnetron sputtering on platinum-coated silicon substrates, and spectral ellipsometry is used to determine their optical characteristics. The ellipsomeric angles were measured in the 250–900-nm wavelength range, and the thicknesses (213 and 54 nm) and the dispersion of the optical constants (the refractive and absorption indices) were determined on the basis of two optical models of the layers.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
