Abstract
Multi-level reflection was obtained on rewritable phase change optical disks with a static tester using different laser amplitudes. Different levels of input power amplitude give rise to different reflection levels. In order to study the mechanism for forming the multi-level reflection, partial crystallization effect and size effect were studied. The partial crystallization effect was studied using differential scanning calorimeter (DSC) measurement and X-ray diffractometer (XRD) measurement. The size effect was studied by simulation and measurement. Based on the simulation and experimental results the combination of size effect and partial crystallization effect is proposed as the main reason to cause the multi-level reflection. This model can be used to analyse the writing, erasing, and overwriting processes of multi-level reflection modulation recording.
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