Abstract
The near-field recording mechanism of the super resolution near-field structure, glass/ZnS-SiO<SUB>2</SUB>/AgO<SUB>x</SUB>/ZnS-SiO<SUB>2</SUB>, has been studied experimentally. Near-field optical effects of the glass/ZnS-SiO<SUB>2</SUB>/AgO<SUB>x</SUB>/ZnS-SiO<SUB>2</SUB> have been observed by a tapping mode tuning-fork near-field scanning optical microscope (TMTF-NSOM) on the transmitting light spot. Laser-excited surface plasmon at the interfaces of AgO<SUB>x</SUB>/ZnS-SiO<SUB>2</SUB> thin film was detected by this technique. Results showed that the transmitting focused light through the AgO<SUB>x</SUB> type super resolution near-field structure consists of a propagating term and an evanescent one resulted from the localized surface plasmon of the AgO<SUB>x</SUB> thin film. A strong enhancement of the near-field intensity and the dynamic localized enhancement of the transmitting focused light were observed as well.
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