Study of the interfacial structure in epoxy bilayer films using neutron reflection

Abstract

AbstractThe interfacial structure in thin epoxy bilayer films was investigated with neutron reflection. For each experiment, a mixture of crosslinker and deuterated resin was spun onto a chemically similar, fully cured, protonated epoxy film. The reflectivity measurements were performed before and after curing the top epoxy film. We focused on the extent of penetration of the components of the top layer into the network of the bottom layer. The effect of the cure temperature of each layer was examined. In addition, the effect of the initial molecular weight of the oligomers in the top layer was probed by the partial curing of the mixture before spinning. As deposited, the components of the top layer penetrated the bottom layer to an extent that was largely independent of the aforementioned factors. The principal observation was that an additional penetration occurred with curing. This additional penetration was dependent upon both the molecular weight of the top layer and the cure temperature of the top layer relative to the glass‐transition temperature of the bottom layer. A decrease in the thickness of the top layer with curing was also observed, which likely indicates some evaporation of oligomers. © 2002 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 40: 1709–1718, 2002